GTLP16T1655MTD Fairchild Semiconductor, GTLP16T1655MTD Datasheet
GTLP16T1655MTD
Specifications of GTLP16T1655MTD
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GTLP16T1655MTD Summary of contents
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... This notification is for your information and concurrence. This is a preliminary notification. A Final PCN will be issued when qualification is complete and data is available. If you require data or samples to qualify this change, please contact Fairchild Semiconductor within 30 days of receipt of this notification. If you have any questions concerning this change, please contact: ...
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Change From Change To Qualification Stress Test and Sample Size Detail Device #1 FAN1655MTFX Package: NMTF0 #Leads: 016 Precondition Description: Stress P/C Standard PCNL1A JESD22-A113 Environment Stress Detail: Stress P/C Standard DOPL JESD22-A108 125C, 0V HAST2 X JESD22-A110 85%RH, 110C, ...
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... HTSL X JESD22-A103 150C THBT X JESD22-A101 85%RH, 85C, 0V 186 TMCL1 X JESD22-A104 -65C, 150C Device #3 GTLP16T1655MTDX Package: NMTD0 064 #Leads: Precondition Description: Stress P/C Standard PCNL3A JESD22-A113 Environment Stress Detail: Stress P/C Standard GATE+ AEC-Q100-006 155C, 400V GATE- AEC-Q100-006 155C, -400V HTSL X JESD22-A103 150C ...